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Maximum magnification - 6000x
The transmission target design fitted to the XT V160’s X-ray source has an ultra thin output window that enables samples to be safely placed within 250 microns of the focal spot providing up to 6000x system magnification.
High resolution - Micron level features
A tightly controlled nanofocus X-ray spot and the latest digital imaging technology ensure that the XT V 160 produces sharp images of micron level features even in the most challenging samples. The advanced electromagnetic lens is computer controlled to ensure that the image remains in focus at all kV settings and the target does not burn when using high power.
High penetration - 160kV
The patented X-Tek Xi "Open Tube" X-ray source is smaller than any other design and allows X-ray images of fine detail in thick and dense samples to be seen with ease. This high energy vacuum de-mountable unit allows views at steep angles through solder joints and heatsinks without ever running out of energy.
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True concentric imaging
The operator chooses a region of interest (ROI) to inspect and positions it in the centre of the screen. Under any combination of rotate, tilt and magnification, the ROI remains completely locked into the center of the field of view.
The true concentric imaging feature operates over the entire scan area of the manipulator. The ROI stays locked in, regardless of the sample’s position on the manipulator table, ideal for inspecting around single or multiple BGA balls.
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True parallel tracking for BGA applications
A combination of tilt and rotate is required to give the best unobstructed view of BGA balls. The next step is to scan along the rows to inspect for failures. With standard manipulators, this necessitates the simultaneous operation of 3 axes - requiring considerable skill on behalf of the operator.
X-Tek's true parallel tracking maintains the X and Y axes parallel to the BGA, allowing the rows to be scanned using a single X or Y axis. This feature is enabled as part of the advanced system control concept.
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Advanced ergonomics
The XT V 160 has been designed for ease-of-use without compromising performance.
Fully adjustable shelves ensure that all system controls are at the operator’s fingertips whether standing or sitting, independent of the person’s height.
The Windows control screen is laid out logically with all regularly used functions in view on single click buttons while movement of the precision joysticks gives a direct and logical response from both sample manipulator and X-ray image.
The system is highly intuitive to operate and as a result, operator training time is significantly reduced.
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Integrated Inspect-X Software
The XT V 160 incorporates the most advanced image capture and analysis software. It runs under Windows XP on the latest specification processing hardware. The resulting data can be saved or exported directly any COM compliant package eg MS Word, Excel, Access and SPC systems . Photo quality printouts can be made on a range of inkjet, laser or thermal printers.
Processing hardware and software are both controlled in-house so that advances in technology can be passed on to the user without delay.
Inspect-X includes special functions for inspection of semiconductor package voids, wire bonding and BGA solder bumps. It also makes use of Microsoft VBA as a scripting/macro language, allowing rapid software customisation to suit specific inspection requirements.
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Footprint efficient
The Xi source releases more of the XT V160’s volume for sample manipulation, providing a generous 400x400mm (16”x16”) scan area in a system with a footprint of only two square metres.
Low cost of ownership
X-Tek’s open X-ray tube development has driven down the size, weight and cost of the system whilst maintaining superior quality and performance. By introducing a patented zero-maintenance cable-less HT generator, the preventative maintenance has been dramatically reduced making the long term cost of ownership considerably lower than any comparable system.
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Product brochures
Electronics inspection
Latest news
09/07/2008
Metris and API announce joint distributor agreement
30/06/2008
Metris acquires CMM software company Integrated Quality Inc.
11/06/2008
Metris receives Best Performer sales growth award
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