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Camio delivers powerful 3D measurement tools using a combination of an intuitive user interface with full graphical display of measurement strategies. Wizard-based functionality for critical metrology functions ensures that your program delivers accuracy and repeatability without the need for specialist programming skills.
Key features
- Best-fit alignments (including RPS with optional iteration and best-fitting of three or more features)
- Automatic feature recognition from measured points
- Comprehensive wizard-based DMIS high level command structure (including automatic error recovery logic)
- Creation of labeled CAD features for all defined, measured or constructed features
- Graphical CAD or wizard-based construction (including CAD-based selection of the required result where multiple answers exist, e.g. one line tangent to two circles has four individual solutions)
- Constant graphical reporting (instant display of an automatically generated graphical report with automatic page layout)
- Automatic probe head angle calculation
- Microsoft® Visual Basic support (develop and run custom VB scripts or programs to aid your inspection process)
Key benefits
- Comprehensive data collection - Feature form is an intrinsic part of modern inspection techniques. Rule-based generation of measurement paths for continuous contact scanning delivers the form data required to analyze work pieces.
- Efficient, professional part programming - Full pictorial user instructions permit programs to be created with a number of differing methodologies: keyboard entry, 'teach' from the joystick control or direct from CAD model data.
- Maximum functionality, minimum familiarity - Camio incorporates many time saving, program generating functions. Therefore, inspection routines can be developed without the need for expertise.
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Latest news
09/07/2008
Metris and API announce joint distributor agreement
30/06/2008
Metris acquires CMM software company Integrated Quality Inc.
11/06/2008
Metris receives Best Performer sales growth award
Upcoming events
Jul 21-25
CMSC
Charlotte, NC, US
Jul 25
South African Tomography Symposium
Johannesburg, South Africa
Sept 8-13
IMTS
Chicago, IL, US
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